| 摘要 |
PURPOSE:To provide high sensitivity measurability for a specimen of a very small amount of attaching Au or Ag by evaporation onto a base board having good infrared penetrativeness, and thereby forming a metal file having a specific thickness. CONSTITUTION:Au or Ag is attached by evaporation onto a base board 2 having good infrared penetrativeness to form a metal film 3 having a thickness of 5-16nm, and thus a specimen holder member 1 is provided. A specimen is held on this member 1 and irradiated with infrared rays IR fed from a light source 4, and the spectrum after penetration of specimen and member 1 is measured by a Fourier transform type infrared spectral photometer (FT-IR) 5. According to this procedure, the infrared ray electric field intensity is intensified on the surface of the film 3, so that the infrared absorption intensity is intensified on the surface of the film 3, so that the infrared absorption intensity is exerted sufficiently, and consequently even a specimen of super-fine quantity can be measured with high sensitivity. |
