| 摘要 |
PURPOSE:To input test data in an information processor in the order of high degree of importance and to improve the efficiency of a test in the information processor by preventing the generation of test data in which the combination of control instructions is the same and arranging test data in the order of high degree of importance. CONSTITUTION:The generation of test data generation instruction information 54 on an auxiliary storage device 5 is started by using a test data generation instruction editing part 46. Test data constitution information 55 showing the combination order based on an attribute is generated. Respective data elements are gathered for respective attributes and generation probabilities are given to the data elements as degree of importance. When all the data elements are gathered, degree of importance is given to them, and the generation of data element constitution information 56 is terminated, a test data generation instruction analysis part 44 starts the generation of a test data base 51 from information 54. The data elements extracted from information 56 are arranged and test data is generated. The generation probabilities of respective data elements are multiplied and the probability of test data is given. |
