发明名称 HIGH-FREQUENCY INDUCTION PLASMA MASS SPECTROGRAPH
摘要 PURPOSE:To be able to measure in a short integral time thus to improve reproducibility by a method wherein laser light transpires a part of a sample and aforesaid transpired samples made corpuscles by carrier gas to be guided to a plasma torch inner tube. CONSTITUTION:Laser light transmits a gas plate 22 to act on a sample 26 to transpire a part of aforesaid sample. Further, the sample transpired in this way is made corpuscles by carrier gas introduced from a carrier gas leading-in tube 27a to be guided from a carrier gas leading-out port 27b to a plasma torch inner tube. Since the leading-in tube 27a and a leading-out port 27b are arranged in the right-angled direction, gas is enabled to sufficiently circulate inside a sample cell to smooth gas replacement so as to give a good analysis result. Accordingly, sample throughput, detection sensitiveness and reproducibility are all improved together with to realize a high-frequency induction plasma mass spectrograph, in which also purge time is shortened.
申请公布号 JPH04104449(A) 申请公布日期 1992.04.06
申请号 JP19900222101 申请日期 1990.08.23
申请人 YOKOGAWA ELECTRIC CORP 发明人 ONO SHOZO
分类号 G01N27/62;H01J49/04;H01J49/26 主分类号 G01N27/62
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