发明名称 INTEGRATED CIRCUIT INSPECTION DEVICE
摘要 PURPOSE:To enable efficiency of inspection to be improved by providing a strobe signal output circuit, by inputting an expected value, and by outputting a strobe position signal which s suited for this expected value. CONSTITUTION:A strobe signal output circuit for outputting a signal which indicates a strobe position which compares an output signal from a circuit to be inspected and its expected value and a judgement circuit 30 for determining pass/fail which compares the output signal and the expected value in synchronization with the strobe signal are provided. Then, an output of an integrated circuit to be evaluated DUT 10 is fed to a voltmeter 30 and a measurement voltage is fed to a circuit 50. Then, when the expected value is high, a selector 60 selects a strobe position for high level and feeds it to the circuit 50. At this time, when the DUT 10 outputs a proper high level, a display 110 indicates 'PASS'. Also, when the expected value is low, the selector 60 selects a strobe position for low level and feeds it to the circuit 50. At this time, when the DUT 10 outputs a proper low level, the display 110 indicates 'PASS'.
申请公布号 JPH04102081(A) 申请公布日期 1992.04.03
申请号 JP19900218102 申请日期 1990.08.21
申请人 TOSHIBA CORP;TOUSHIBA MAIKURO EREKUTORONIKUSU KK 发明人 OHASHI KAZUHIKO
分类号 G01R31/28;G01R31/3193 主分类号 G01R31/28
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