发明名称 Process for fabricating integrated circuits.
摘要 <p>Integrated circuits employing titanium nitride are significantly improved by using a specific method for formation of the titanium nitride in the device fabrication. In particular, a plasma such as one formed in an electron cyclotron resonance apparatus is employed to dissociate a source of nitrogen and a source of hydrogen and the dissociation products are combined at the integrated circuit deposition substrate with titanium tetrachloride. The resulting deposition is essentially devoid of chlorine and has advantageous step-coverage properties.</p>
申请公布号 EP0478233(A2) 申请公布日期 1992.04.01
申请号 EP19910308581 申请日期 1991.09.20
申请人 AMERICAN TELEPHONE AND TELEGRAPH COMPANY 发明人 FOO, PANG-DOW;PAI, CHIEN-SHING
分类号 H01L21/285;C23C16/32;C23C16/50;C23C16/511;H01L21/28;H01L21/768 主分类号 H01L21/285
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