| 摘要 |
PURPOSE:To shorten processing time by performing the pattern matching of an image to be inspected obtained from an image pickup device with a reference image by pattern collation by using a template. CONSTITUTION:The image to be inspected from the image pickup device 11 is pattern-collated with the reference image of a reference image memory circuit 16. A vertical image data extraction circuit 14 outputs image data to be inspected of seven rows opened uniformly at certain set intervals in the vertical direction of the image to be inspected simultaneously. A horizontal image data extraction circuit 15 connects output from the vertical image data extraction circuit 14, and outputs the point data of 49 binary images simultaneously. An arithmetic and logic circuit 17 performs the pattern comparison of reference image data with horizontal image data, and outputs the coincidence pulse of picture element frequency. A correlation value estimation circuit 18 performs the pattern collation of 49 data, and estimates and stores a correlation value at each coordinate position individually. |
