发明名称 CHIP TEST CONDITION SELECTION METHOD AND APPARATUS
摘要 A microprocessor integrated circuit chip includes a plurality of functional areas containing a large number of widely distributed signal sources. An on-chip selection network is distributed on the chip which enables the selection of signals from the large number of sources under microinstruction control without any decrease in chip performance. The network includes an access bus which is distributed to the functional areas as a function of the concentration of signals provided by the sources. Individual decoders are strategically located on the chip and connect in common to a control bus. Each decoder connects to a plurality of switches for linking the sources of functional area to the access bus. A selector circuit terminates the access bus at one end. Under microprogram control, the selector circuit is enabled to select which final source signal is applied to the functional area containing branching circuits for selecting a next microinstruction to be executed by the microprocessor.
申请公布号 CA1298412(C) 申请公布日期 1992.03.31
申请号 CA19880562478 申请日期 1988.03.25
申请人 HONEYWELL BULL INC. 发明人 HESLIN, PETER M.
分类号 G06F9/26 主分类号 G06F9/26
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