发明名称 DIAGNOSTIC SYSTEM FOR INFORMATION PROCESSOR
摘要 PURPOSE:To easily detect a defective position at the time of generating a fault and to execute processing within a short period by providing this diagnostic system with a means for automatically pointing out the fault position. CONSTITUTION:An information processor l is provided with a start small test means 1111 for executing a test by the minimum number of hardwares and successively expanding a test range, a test ID setting means 1112 for setting up a test number in a software (SF) visible register 12 prior to the execution of respective tests in a test program and a logout requesting means 1113 for outputting an error log sampling request to a service processor 3 connected to the processor l through a diagnostic pass 2. The service processor 3 is provided with an error logging means 311 for sampling an error log in an error log file 41 when a request is outputted from the means 113 and an error log analyzing means 312 for displaying a defective parts name based upon a test ID. Consequently, a defective position can easily be detected at the time of generating a fault and the fault can be repaired within a short time.
申请公布号 JPH0497445(A) 申请公布日期 1992.03.30
申请号 JP19900216078 申请日期 1990.08.16
申请人 NEC CORP 发明人 NISHIKAWA AKIKO
分类号 G06F11/34;G06F11/22 主分类号 G06F11/34
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