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发明名称
TIMING CALIBRATING METHOD FOR IC TESTER
摘要
申请公布号
JPH0495784(A)
申请公布日期
1992.03.27
申请号
JP19900210092
申请日期
1990.08.08
申请人
ADVANTEST CORP
发明人
SHIMAZAKI NORIAKI
分类号
G01R31/28
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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