| 摘要 |
PURPOSE:To inspect picture elements at a peripheral part by providing a processing area extending circuit correcting the effect of shading of a picture element data so as to extend the area of the picture element data of the solid- state image pickup element with respect to the surrounding part to the inspection device. CONSTITUTION:A solid-state image pickup element 30 to be inspected is driven by a drive circuit 16, the solid-state image pickup element 30 outputs picture element data sequentially depending on the arrangement of photoelectric conversion cells, the data are converted into a digital signal by an A/D converter 11 sequentially and stored in a storage device 12 corresponding to the arrangement of the photoelectric conversion cells. Then a processing area extending circuit 13 generates a picture element data at the extended section while correcting the shading at the peripheral of the picture element data, the picture element data stored in the storage device 14 is fetched in a processing circuit 15, the arithmetic processing is applied based on the picture element data subject to shading by using a Laplacian filter 40 and propriety decision is implemented for a defect check. Thus, the peripheral part is checked. |
