发明名称 Method for forming a pattern of a photoresist
摘要 An ultraviolet light sensitive photoinitiator composition that includes at least one anthracene derivative represented by the formula: <IMAGE> wherein X is CH=CH2 or -(-CH2-)-nO-(-R) with R being H or <IMAGE> wherein each RI, RII and RIII individually is selected from the group of alkyl, alkenyl, aryl, <IMAGE> and <IMAGE> wherein each RIV, RV and RVI individually is selected from the group of alkyl, alkenyl and aryl; wherein m is an integer of 0 to 4, p is an integer of 0 to 4; and is n being 1 to 2; and onium salt; and an organic solvent. The composition is used for cationic polymerization of cationic polymerizable materials including in the formation of a pattern of a photoresist. Also certain novel epoxy-functionalized organosilicons are provided that are sensitive to radiation including E-beam radiation and exhibit resistance to oxygen reactive ion etching.
申请公布号 US5098816(A) 申请公布日期 1992.03.24
申请号 US19910683778 申请日期 1991.04.11
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BABICH, EDWARD D.;GELORME, JEFFREY D.;HATZAKIS, MICHAEL;SHAW, JANE M.;STEWART, KEVIN J.;WITMAN, DAVID F.
分类号 G03F7/027;G03F7/029;G03F7/075 主分类号 G03F7/027
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