发明名称 |
DRY-TYPE DEVELOPING APPARATUS |
摘要 |
PURPOSE:To execute a reactive ion etching operation with large anisotropy by a method wherein microwaves are used to generate the plasma of a gas containing oxygen and low-frequency AC electric power is applied. CONSTITUTION:A prescribed gas is introduced into a process chamber 1 from a gas introduction hole 2; on the other hand, the inside of the chamber is evacuated by using a vacuum pump 3 for evacuation use via a valve 4. Microwaves in an H 001 mode at 2.45 GHz are introduced into the process chamber 1 form microwave oscillators 5A and 5B; the plasma of a gas containing oxygen is generated. An electrode 11 which holds a semiconductor wafer 10 to be treated is installed inside the process chamber. The electrode 11 is cooled by a coolant from a cooler 14. AC electric power at 20 to 200KHz is applied to the electrode 11 from a low-frequency power supply 15; oxygen ions in the microwave plasma are pulled into a resist film formed on the semiconductor wafer 10; an anisotropic etching operation is executed. |
申请公布号 |
JPH0487320(A) |
申请公布日期 |
1992.03.19 |
申请号 |
JP19900201288 |
申请日期 |
1990.07.31 |
申请人 |
JAPAN SYNTHETIC RUBBER CO LTD |
发明人 |
YANAGIHARA KENJI;NUMATA MASAYUKI;KAWAMURA SHINICHI |
分类号 |
G03F7/36;H01L21/027;H01L21/302;H01L21/3065 |
主分类号 |
G03F7/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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