发明名称 Method and apparatus useful in the plasma etching of semiconductor materials
摘要 In a plasma reaction chamber or the like having a supporting electrode for receiving a selected substrate to be etched, a coolant gas is introduced into one region between this substrate and electrode for increasing the heat transfer capacity therebetween. Differential sealing means are provided adjacent to the coolant gas receiving region and define an enclosed space between the substrate and its supporting electrode to which a partial vacuum may be applied. This partial vacuum prevents any cooling gas from by-passing the sealing means and entering the plasma reaction chamber and producing deleterious chemical reaction effects therein.
申请公布号 US5096536(A) 申请公布日期 1992.03.17
申请号 US19900536732 申请日期 1990.06.12
申请人 发明人
分类号 H01J37/32;H01L21/00;H01L21/683 主分类号 H01J37/32
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