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发明名称
SEMICONDUCTOR DEVICE PROVIDED WITH INSPECTION MOS TYPE TRANSISTOR
摘要
申请公布号
JPH0484450(A)
申请公布日期
1992.03.17
申请号
JP19900200314
申请日期
1990.07.27
申请人
NEC CORP
发明人
SAIGO SATOSHI
分类号
H01L29/78;H01L21/66;H01L21/82;H01L21/8234;H01L27/088;H01L27/118
主分类号
H01L29/78
代理机构
代理人
主权项
地址
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