发明名称 PROBE
摘要 PURPOSE:To improve reliability of inspection by subjecting a tubular object to be inspected to flaw detection in the axial and circumferential directions thereof by using a probe provided with a coil for detection provided on a core coaxial with the central axis of said object and the other coil for detection deviating from the central axis of the object. CONSTITUTION:A probe 1 is formed of a detecting coil 3 wound concentrically with the central axis of an object 2 to be detected, the other detecting coil 5 having the central axis prependicular to the central axis of the object 2 and a common core 7 and is connected via lead wires 4 and 6 to an outside AC power source. When AC current is passed to the coils 3 and 5, eddy current flows in the object 2 owing to an induction effect and the eddy current changes according to the presence or absence of a defect existing in the object to be detected and therefore the change in said current is detected by the coils 3 and 5. The position of the defect existing in the object to be inspected is thus detected by scanning the probe 1 in the axial and circumferential directions respectively.
申请公布号 JPS60157047(A) 申请公布日期 1985.08.17
申请号 JP19840011844 申请日期 1984.01.27
申请人 HITACHI SEISAKUSHO KK;BABCOCK HITACHI KK 发明人 KOBANAWA AKIRA
分类号 G01N27/90 主分类号 G01N27/90
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