发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To reduce the number of wirings while enabling driving at a TTL level normally used by unifying a high withstanding-voltage field-effect semiconductor device and a logic circuit, such as a shift register, a latch, a gate, etc. CONSTITUTION:An insulator layer 31 is attached to a p-type semiconductor substrate 30, and n-type ions are implanted partially to form an n-type ion implantation layer 41 to the substrate 30. Thick insulating substance layers 33 are shaped through oxidation, and a p-type impurity is ion-implanted or diffused from openings 35, 37 to form p-type impurity layers 42. An n-type impurity is diffused similarly to shape n-type impurity layers 43-1-43-4. Accordingly, a high withstanding-voltage field-effect semiconductor device and a logic circuit are unified and manufactured by using a DSA technique, thus simplifying a manufacturing process, then easily preparing the circuit because the manufacture is performed with the same semiconductor substrate 30.
申请公布号 JPS61172365(A) 申请公布日期 1986.08.04
申请号 JP19850246491 申请日期 1985.10.31
申请人 SHARP CORP 发明人 TAMAOKI HIROSHI;HATTORI HIROKI;AWANE KATSUTERU;BIWA TETSUO
分类号 H01L21/8234;H01L27/08;H01L27/088;H01L29/78 主分类号 H01L21/8234
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