METHOD FOR EVALUATING DESTRUCTION OF RESIN SEALED SEMICONDUCTIVE CHIP,申请号JP19850217988-传众专利搜索

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发明名称	METHOD FOR EVALUATING DESTRUCTION OF RESIN SEALED SEMICONDUCTIVE CHIP
摘要
申请公布号	JPS6279328(A)	申请公布日期	1987.04.11
申请号	JP19850217988	申请日期	1985.10.02
申请人	OKI ELECTRIC IND CO LTD	发明人	TABATA SHIGERU;YAMAHA TAKAHISA
分类号	G01R31/26;G01N3/30	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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