| 摘要 |
PURPOSE:To shorten a testing time by providing with the first circuit opening and closing measure breaking a connection between a function block and an output buffer, and th second circuit opening and closing measure operating complementarily with the first circuit opening and closing measure between an input buffer and the output buffer. CONSTITUTION:A semiconductor integrated circuit 101 consists of a function blocks 102 and 103, a test circuit 104, etc. A test signal input terminal 116 is made '1' in the test execution time of an input buffer element 106 and an output buffer element 107. Transfer gates 139 to 144 are made 'OFF' and clocked inverters 133 to 138 within the test circuit 104 are made 'ON' by inverters 132 and 145 at this time. Therefore, the outputs of the function blocks 102 and 103 are not transmitted to an output buffer element 107 and signals input from input terminals 108 to 113 are transmitted to the output buffer element 107 through the input buffer element 106 and the clocked inverters 133 to 138 within the test circuit 104. |
