发明名称 TECHNIQUE FOR FABRICATING COMPLEMENTARY DIELECTRICALLY ISOLATED WAFER
摘要 Technique For Fabricating Complementary Dielectrically Isolated Wafer A method has been developed for providing tub regions with various resistivities in a dielectrically isolated (DI) structure. The starting substrate material is etched to expose the locations designated for a resistivity modification, and epitaxial material of the modified resistivity value is used to fill the exposed tubs. The remainder of the fabrication process follows conventional DI fabrication techniques. The procedure may simply be used to create a DI structure containingboth n-type and p-type tub regions. The idea may also be extended, however, to providing separate tubs with, for example, n+ resistivity, n- resistivity, presistivity and p+ resistivity, all within the same DI structure.
申请公布号 CA1297210(C) 申请公布日期 1992.03.10
申请号 CA19890589663 申请日期 1989.01.31
申请人 AMERICAN TELEPHONE AND TELEGRAPH COMPANY 发明人 EASTER, WILLIAM G.;LEFFEL, DANIEL D.
分类号 H01L21/762 主分类号 H01L21/762
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