| 摘要 |
Device for infrared illumination of a controlled duration, which can be used especially for inspecting components using controlled infrared thermography, including a lamp (1) containing a filament through which an electrical current may pass, and a reflector mounted so as to rotate about an axis passing in the vicinity of the lamp, with means (11, 12) for driving the reflector in rotation at a speed calculated as a function of the desired irradiation duration and means (14) for absorbing the radiation emitted by the lamp and deflected by the reflector into a direction other than that of the object. Preferably, the reflector (6) is elliptical or parabolic, the filament (2) being close to its focus, and the absorption means comprising a casing cooled by liquid. <IMAGE>
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