发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To manufacture a semiconductor device of stable characteristics with a high reproducibility by a method wherein the channel part is protected an insulating layer before a high impurity concentration semiconductor layer is built up to form the source and drain regions. CONSTITUTION:After a p-type Si layer 101 is formed on a glass substrate 100, a silicon nitride layer 102 is formed and then a photoresist pattern 103 is formed and the layer 102 is etched with the pattern 103 as a mask Then an n<+>type Si layer 104 is built up on the pattern 103 and the resist pattern 103 is removed. At the same time, the layer 104 on the resist pattern 103 is removed. Then a silicon nitride layer 105 is formed and the layer 105 is patterned to form apertures for leading out electrodes. Then electrodes 106 are formed. With this constitution, as the channel part is protected by the insulating layer, it is not contaminated. Therefore, a semiconductor device of stable characteristics can be produced with a high reproducibility.
申请公布号 JPS6412576(A) 申请公布日期 1989.01.17
申请号 JP19870169502 申请日期 1987.07.07
申请人 CANON INC 发明人 KAWAKAMI SOICHIRO
分类号 H01L21/302;H01L21/28;H01L21/3065;H01L21/3205;H01L21/336;H01L27/12;H01L29/78;H01L29/786 主分类号 H01L21/302
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