发明名称 VERFAHREN ZUM SCHUTZ VON POLIERTEN SILICIUMOBERFLAECHEN.
摘要 Not more than 10 hrs. after the polished slices have been given a standard clean in oxidising conditions they are exposed to the action of a reagent which is able to cause the attachment of tri-alkylsilane gps. to the wafer-surface. The reagents are from the gp. of hexaalkyldisilazane, pref. hexamethyldisilazane (HMD). The exposure is carried out pref. to the reagent in gas-form in a concn. of up to 15 mg/l. in a carrier-gas for a duration of 0.5-5 mins. The layer formed on the Si-wafer is removed by a thermal oxidn.
申请公布号 DE3683598(D1) 申请公布日期 1992.03.05
申请号 DE19863683598 申请日期 1986.11.13
申请人 WACKER-CHEMITRONIC GESELLSCHAFT FUER ELEKTRONIK-GRUNDSTOFFE MBH, 8263 BURGHAUSEN, DE 发明人 LAMPERT, INGOLF, W-8263 BURGHAUSEN, DE
分类号 C30B33/00;C23C16/02;C23C16/22;C23C16/40;C30B33/10;H01L21/02;H01L21/304;H01L21/306;H01L21/312;(IPC1-7):H01L21/312 主分类号 C30B33/00
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