发明名称 Method and device for analyzing gas in process chamber
摘要 A gas in a process chamber, such as a sputtering chamber, having a typical inside pressure of 10-1 to 10-3 Torr, is analyzed by a mass spectrometer, which should be used at a pressure range of lower than around 10-4 Torr. The method comprises evacuating a process chamber by a vacuum pump and supplying a gas to the process chamber, whereby a pressure in the process chamber is determined by the vacuum pump and the supplied gas, and that pressure in the process chamber is higher than a pressure in the vacuum pump, and analyzing the gas at a portion of or around the vacuum pump, which portion has a pressure lower than the pressure in the process chamber, by using a mass spectrometer.
申请公布号 US5093571(A) 申请公布日期 1992.03.03
申请号 US19900546805 申请日期 1990.07.02
申请人 FUJITSU LIMITED 发明人 INOMATA, JURO;NAKAMURA, MASARU
分类号 G01N27/62;B01J3/00;H01J37/32;H01J49/04 主分类号 G01N27/62
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