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发明名称
SEMICONDUCTOR MEMORY TESTING DEVICE
摘要
申请公布号
JPH0461699(A)
申请公布日期
1992.02.27
申请号
JP19900171907
申请日期
1990.06.27
申请人
MITSUBISHI ELECTRIC CORP
发明人
MATSUMOTO JUNKO
分类号
G01R31/28;G11C29/00;G11C29/56;H01L21/66
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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