LOGIC CIRCUIT WITH LOGIC TESTING FUNCTION,申请号JP19900166731-传众专利搜索

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发明名称	LOGIC CIRCUIT WITH LOGIC TESTING FUNCTION
摘要
申请公布号	JPH0458172(A)	申请公布日期	1992.02.25
申请号	JP19900166731	申请日期	1990.06.27
申请人	HITACHI LTD	发明人	KAWASAKI KAZUHIRO
分类号	G01R31/317;G01R31/28;H03K19/00	主分类号	G01R31/317
代理机构		代理人
主权项
地址

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