发明名称 TRIP TESTING DEVICE FOR LOOPED SYSTEM PROTECTIVE DEVICE
摘要 PURPOSE:To prevent the occurrence of a power failure caused by a wrong operation command by sending a trip command from a CPU when a trip-enable signal received by the CPU from a slave-station device meets the condition of a testing tool output and a trip command to a required circuit breaker from the slave-station device when the trip-enable signal meets the condition of the trip command. CONSTITUTION:A slave station in a test mode selects trip-enable signals for each circuit breaker and transmits the selected signals to CPU MS1 and MS2. Upon receiving the trip-enable signals, the CPU MS1 and MS2 in the test mode transmit trip signals for pertinent circuit breakers to the slave station. In case the trip command is transmitted from the CPU MS1, the output is sent when coincidence is obtained at the 11th gate section 13. When coincidence is obtained with the trip-enable signal at the 13th gate section 15, the CPU MS1 outputs the trip command and a desired circuit breaker is tripped. Therefore, transmission of the trip command to circuit breakers other than the desired circuit breaker to be tested can be prevented even when the output of the trip command is wrongly set at the CPUs.
申请公布号 JPH0458718(A) 申请公布日期 1992.02.25
申请号 JP19900165970 申请日期 1990.06.25
申请人 MEIDENSHA CORP 发明人 SHIRASAGO HIROAKI;KAWASAKI YOSHIHIRO
分类号 H02H3/05;H02H3/28 主分类号 H02H3/05
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