DUAL-SIDED TEST HEAD HAVING FLOATING CONTACT SURFACES

摘要

A dual-sided test head for an integrated circuit test system. Each side of the test head has a floating contact surface which provides an electrical contact interface between one side of the test head and a respective load board. Each load board is part of a respective integrated circuit handling system. As the test head has two sides and a load board is contacted at each side, the floating contact surfaces facilitate docking of the test head to the respective load boards. The contactors are floating so as to have freedom of motion to rotate, tilt, offset laterally or offset vertically, relative to the test head.