发明名称 MBE growth technology for high quality strained III-V layers
摘要 III-V films are grown on large automatically perfect terraces of III-V substrates which have a different lattice constant, with temperature and Group II and V arrival rates chosen to give a Group III element stable surface. The growth is pulsed to inhibit Group III metal accumulation to low temperature, and to permit the film to relax to equilibrium. The method of the invention 1) minimizes starting step density on sample surface; 2) deposits InAs and GaAs using an interrupted growth mode (0.25 to 2 mono-layers at a time); 3) maintains the instantaneous surface stoichiometry during growth (As-stable for GaAs, In-stable for InAs); and 4) uses time-resolved RHEED to achieve aspects (1)-14 (3).
申请公布号 US5091335(A) 申请公布日期 1992.02.25
申请号 US19900506137 申请日期 1990.03.30
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF THE NATIONAL AERONAUTICS AND SPACE ADMINISTRATION 发明人 GRUNTHANER, FRANK J.;LIU, JOHN K.;HANCOCK, BRUCE R.
分类号 H01L21/20;H01L21/203 主分类号 H01L21/20
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