发明名称 INSPECTION DEVICE
摘要 PURPOSE:To easily measure the defect and damage state of a sample in a short time by receiving waves of specific frequency from a frequency oscillator by a pulse sensor through the body to be measured and analyzing the vibration. CONSTITUTION:A pulser 22 and a pulse sensor 3 are fitted on the surface of the body 5 to be measured at a specific interval and the wave is oscillated from a frequency oscillator 2 is transmitted to the body 5 to be measured through the pulser 22 under the control of a vibration generation controller 21 within a frequency range of about 10 - 3 kHz. Then the wave which is propagated in the body 5 to be measured as an elastic wave is received by the sensor 3 and amplified 6, and then a filter 7 removes its noise; and an oscilloscope 8 performs conversion into a voltage waveform, which is compared with analytic data on nondefective articles stored as a data base in an analytic device 4 to analyze the defect and damage state. Thus, the measurement becomes possible only by the simple operation wherein the oscillator 2 and sensor 3 are only fitted, so the defect state of a large-sized structure, a device, etc., can easily be measured at the actual site.
申请公布号 JPH0450764(A) 申请公布日期 1992.02.19
申请号 JP19900160337 申请日期 1990.06.18
申请人 SEKISUI CHEM CO LTD;MAEKAWA ZENICHIRO;HAMADA YASUMOCHI 发明人 NAITO HAJIME;SHINOBU MASAYASU;MAEKAWA ZENICHIRO;HAMADA YASUMOCHI
分类号 G01N29/22 主分类号 G01N29/22
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