| 摘要 |
PURPOSE:To measure an ultrasonic wave under conditions corresponding to a sample by providing a data memory, a display data generating means, and a display means. CONSTITUTION:A flaw detector part 1 receives an echo reception signal from a probe 16 under the control of a microprocessor (MPU) 15 and outputs it to an A/D converting circuit 2. The A/D converting circuit 2 samples the echo reception signal as to a surface reflected wave, a defect reflected wave, a bot tom surface reflected wave, etc., according to the control signal from the MPU 5, and converts those outputs into digital values, which are sent out to a waveform data memory 3 in order. The MPU 5 when receiving a sampling end signal from the waveform data memory 3 stops the sampling and samples measurement data from the waveform data memory 3 to generate display data on a A scope image, thereby displaying the A scope image corresponding to the generated display data on an display device 8. |
