APPARATUS AND A METHOD FOR CHECKING A SEMICONDUCTOR,申请号US19900633307-传众专利搜索

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发明名称	APPARATUS AND A METHOD FOR CHECKING A SEMICONDUCTOR
摘要
申请公布号	US5089774(A)	申请公布日期	1992.02.18
申请号	US19900633307	申请日期	1990.12.24
申请人	SHARP KABUSHIKI KAISHA	发明人	NAKANO, AKIHIKO
分类号	G01R31/302;G01R31/305	主分类号	G01R31/302
代理机构		代理人
主权项
地址

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