发明名称 Method for preventing junction leakage in field emission displays
摘要 A method for fabricating a field emission display (FED) with improved junction leakage characteristics is provided. The method includes the formation of a light blocking element between a cathodoluminescent display screen of the FED and semiconductor junctions formed on a baseplate of the FED. The light blocking element protects the junctions from light formed at the display screen and light generated in the environment striking the junctions. Electrical characteristics of the junctions thus remain constant and junction leakage is improved. The light blocking element may be formed as an opaque light absorbing or light reflecting layer. In addition, the light blocking element may be patterned to protect predetermined areas of the baseplate and may provide other circuit functions such as an interconnect layer.
申请公布号 US5866979(A) 申请公布日期 1999.02.02
申请号 US19970897240 申请日期 1997.07.18
申请人 MICRON TECHNOLOGY, INC. 发明人 CATHEY, JR., DAVID A.;LEE, JOHN
分类号 G09F9/30;H01J9/02;H01J29/04;H01J29/06;H01J29/89;H01J31/12;(IPC1-7):H01J1/30;H01J19/24 主分类号 G09F9/30
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