| 摘要 |
<p>A dynamic random access memory comprises a sense amplifier including a latch (10) comprising a pair of NMOS FETs (TN1,TN2) with their gates and drains cross coupled and with their sources connected to a common node. A pair of bitlines (BL,BLN) are coupled to the cross coupled nodes of the latch (10). An FET (TP5) enables the bitlines to be precharged to a precharge voltage. A latch driving circuit (16) is coupled to the common node of the latch (10). The latch driving circuit (16) comprises means (TN5,TN6) for coupling a reference voltage to the common node for activating the latch (10) after the bitlines have been precharged, and means (TN7,20) for controlling the voltage of the common node in such a manner that the downward voltage swing of the lower level bitline towards the reference voltage, produced by activation of the latch (10), is limited to a predetermined voltage level higher than the reference voltage. This advantageously provides a high speed memory operation and reduced power consumption. <IMAGE></p> |
