发明名称 Test chambers.
摘要 <p>A product carrier (12) has an extended external terminal port (44) through which the external test circuit connections are made. The combination of the product carrier with a test chamber (10) is configured to accommodate an extended port (44) so that the connections to the external test circuit are removed from the test chamber environment. The product carrier (12) includes a support structure which physically orients the product in the chamber and includes an electrical junction arrangement (22,24,26) through which the product can be connected to a test circuit. The electrical junction (24), or junctions, when positioned within the test chamber (10) are connected to an external test circuit which controls the cycling of the product through a preselected test procedure. The electrical circuitry for making the electrical connection to the external connector is incorporated in the product carrier (12). &lt;IMAGE&gt;</p>
申请公布号 EP0470303(A1) 申请公布日期 1992.02.12
申请号 EP19900304843 申请日期 1990.05.03
申请人 VENTUREDYNE, LTD 发明人 LIKEN, PETER A.;HARTWIG, KEVIN L.;MARTIN, PETER A.
分类号 G01R1/04;G01R31/28 主分类号 G01R1/04
代理机构 代理人
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