发明名称 Semiconductor memory device transistor and cell structure
摘要 A dymanic random access memory device is constructed in which a first layer of semiconductive material is used to form series of transistors, using buried contacts on a silicon substrate. A dielectric is formed over the surface, and memory cells include a second layer of semiconductive material which is deposited over a dielectric. The active regions of the DRAM form a "dogbone" pattern, in which active regions exhibit elongate shapes in which each end of the elongate shape is wider than a center leg, and adjacent "dogbone" shapes are nested to form a compact pattern.
申请公布号 US5087951(A) 申请公布日期 1992.02.11
申请号 US19910713535 申请日期 1991.06.06
申请人 MICRON TECHNOLOGY 发明人 CHANCE, RANDAL W.;LOWREY, TYLER A.
分类号 H01L27/105;H01L27/108 主分类号 H01L27/105
代理机构 代理人
主权项
地址