HEIGHT MICROMETER CORRECTION SYSTEM USING LASER INTERFERENCE EQUIPMENT

摘要

A correcting device for height micrometer uses laser interference to improve the accuracy and to reduce the correcting time. The said device includes a height micrometer (H) equipped with gage blocks (G)(G') to be corrected, and the micrometer is set on a surface plate (1) with a correcting device (2) sitting opposite to it. The device (2) has a two-stage feeding member (4) moving along the cylindrical column (3) by a step motor (S). The one stage of the feeding member installs a laser reflector (corner cube) (5) moving horizontally by another step motor (S1) and an electric micrometer (E) attaching a measuring hand (6). A laser interferometer (11) is installed on the top of the correcting device.