发明名称 FORMING METHOD FOR ELECTRODE AND WIRING LAYER OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To readily obtain aluminum electrode and wire by laminating W, T, Nb, etc. on an aluminum layer, etching it with gas plasma containing F, and then etching it with gas plasma containing chlorine. CONSTITUTION:Al4, W5 are sputtered on an oxidized film 3 containing the exposed part of an active layer 2. A resist mask 6 is covered thereon, and when it is exposed with gas plasma of CF4:Ar=3:7, the W readily becomes fluoride and is selectively etched. When it is then treated with gas plasma of CCl4:Ar=3:7, the aluminum becomes chloride, and is thus etched, Al2O3 is not formed on the surface, and microminiature pattern of aluminum electrode and wiring can be readily obtained. Similarly, the electrode and wire can be obtained by using metals readily forming fluoride, e.g., Ti, Mo, Nb., etc.
申请公布号 JPS5726431(A) 申请公布日期 1982.02.12
申请号 JP19800102000 申请日期 1980.07.24
申请人 MITSUBISHI ELECTRIC CORP 发明人 SUZUKI YOSHIKI;WATAKABE YAICHIROU;YAMAZAKI TERUHIKO
分类号 H01L23/52;H01L21/28;H01L21/3205 主分类号 H01L23/52
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