| 摘要 |
A test fixture for automatic testing equipment wherein a short wire interface assembly permits the interface assembly to be hard wired to a test head assembly with relatively short interconnect wires. The interface assembly includes a base cover plate having a plurality of cavities formed therein, a plurality of individual interface strips having flexible vacuum seals affixed thereto and interface contacts disposed therethrough, and a plurality of floating captive contacts disposed in the base cover plate to provide a mechanical and electrical interface between the interface contacts and spring-loaded probes electrically connected to the ATE. The individual interface strips are readily positionable adjacent the test head assembly to facilitate hard wiring therebetween. Further, the individual interface strips are rotatable to provide easy access to the interface contacts for hard wiring. The hard wired interface strips are suspended in respective cavities of the base cover plate with the flexible vacuum seals in contact with a surface of the base cover plate. During ATE testing a vacuum pressure is applied to the other surface of the base cover plate and the high initial loading of the spring-loaded probes is exerted against the floating captive contacts. Limiting the translation of the floating captive contacts correspondingly limits the deflection of the individual interface strips. The flexible vacuum seals are designed to be load-insensitive, that is, the deflection of the interface strips causes a limited flexure in the flexible vacuum seals which is insufficient to disrupt the atmospheric pressure induced sealing contact between the outer edges of the flexible vacuum seals and the base cover plate. |
