发明名称 |
APPARECCHIATURA PER PROVARE AUTOMATICAMENTE UN MODO DI SOLLECITAZIONE DI UN DISPOSITIVO DI MEMORIA E SEMICONDUTTORE |
摘要 |
In a highly integrated semiconductor memory device, apparatus for setting a stress mode without applying a stress voltage from the exterior is provided. A triggered time point TS to a stress mode can be set by greatly raising an internal supply voltage when the external supply voltage is raised to a voltage over the stress voltage. |
申请公布号 |
ITMI920155(D0) |
申请公布日期 |
1992.01.28 |
申请号 |
IT1992MI00155 |
申请日期 |
1992.01.28 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HAN NJIN-M;LEE JONG-HOON |
分类号 |
G11C11/413;G01R31/30;G01R31/317;G11C11/401;G11C11/407;G11C29/00;G11C29/14;G11C29/46;G11C29/50;(IPC1-7):H03B |
主分类号 |
G11C11/413 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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