发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE:To protect a semiconductor memory device against soft error caused by the impingement of alpha particles by a method wherein a memory cell capacitor is formed above the source of a switching transistor provided above an island region, and signal charge is stored in a capacitor insulating film provided between a storage electrode and a cell plate electrode. CONSTITUTION:In a memory cell provided onto a semiconductor substrate, a source 7 of a switching transistor is formed above an island region 3, a storage electrode 8 is provided above the source 7, and a plate electrode 10 is built on the storage electrode 8 through the intermediary of a capacitor insulating film 9. A drain 4 of the switching transistor is provided under the island region 3 and electrically connected to a bit line provided to the base of a groove. By this setup, a cell can be formed high in density and resistance to soft error induced by the impingement of alpha particles.
申请公布号 JPH0425171(A) 申请公布日期 1992.01.28
申请号 JP19900130670 申请日期 1990.05.21
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 YASUHIRA MITSUO;MATSUYAMA KAZUHIRO;NAITO KOJI
分类号 H01L27/04;H01L21/822;H01L21/8242;H01L27/10;H01L27/108 主分类号 H01L27/04
代理机构 代理人
主权项
地址