TESTING METHOD OF IC,申请号JP19900128610-传众专利搜索

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发明名称	TESTING METHOD OF IC
摘要
申请公布号	JPH0424573(A)	申请公布日期	1992.01.28
申请号	JP19900128610	申请日期	1990.05.18
申请人	ADVANTEST CORP	发明人	ICHIYOSHI SEIJI
分类号	G01R31/26;G01R31/28	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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