METHOD AND APPARATUS FOR MEASURING THICKNESS OF EXTREMELY THIN FILM, AND INFRARED LAMP FOR THE MEASUREMENT,申请号JP19900125762-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	METHOD AND APPARATUS FOR MEASURING THICKNESS OF EXTREMELY THIN FILM, AND INFRARED LAMP FOR THE MEASUREMENT
摘要
申请公布号	JPH0420804(A)	申请公布日期	1992.01.24
申请号	JP19900125762	申请日期	1990.05.16
申请人	JIYAPAN SENSAA KK	发明人	TAKADA HIDEO
分类号	G01B11/06	主分类号	G01B11/06
代理机构		代理人
主权项
地址

您可能感兴趣的专利

Light scattering measuring probe

Automated association of operations with objects in a graphical window

Process for racemizing optically active vinyl-substituted cyclopropanecarboxylic acid compound

Vulcanizable rubber mixes

Composition having sealing and sound dampening properties and methods related thereto

Information processing apparatus, method, and computer-readable medium

Chrysanthemum plant named 'Swing Time Dark'

Connection apparatus for optical coherence tomography catheters

Methods to minimize moisture condensation over a substrate in a rapid cycle chamber

Construction of trainable semantic vectors and clustering, classification, and searching using trainable semantic vectors

Method and apparatus to facilitate accessing data in network management protocol tables

Record medium and method of controlling access to record medium

System and method for providing feedback to a driver of a hybrid vehicle

Positive-working photoresist composition

Positive photosensitive composition

Heme supplement and method of using same

Mucosal cytotoxic T lymphocyte responses

Method for splicing a conveyor belt

Dust filtration frame and disposal cover

Method of displaying temporal and storage media relationships of file names protected on removable storage media