发明名称 TEST SEMICONDUCTOR DEVICE SORTING APPARATUS
摘要 An apparatus for sorting a semiconductor device is provided to simplify a structure thereof by performing only a sorting process therein. A plurality of user trays are loaded on a user tray loading unit(10). A test tray loading unit(30) includes a loading work part for elevating a plurality of test trays by using an elevation unit and a loading finishing part for stacking the test trays. A test tray unloading unit(40) includes an unloading work part for unloading the test trays and an unloading finishing part for stacking the test trays. A user tray unloading unit(20) loads a plurality of empty user trays according to a test result. One or more pickers(51,52) are used for transferring semiconductor devices between the user tray loading unit and the test tray loading unit or between the test tray loading unit and the user tray unloading unit.
申请公布号 KR100674416(B1) 申请公布日期 2007.01.29
申请号 KR20050068913 申请日期 2005.07.28
申请人 MIRAE CORPORATION 发明人 PARK, YONG GEUN;PARK, JAE WAN;YANG, GUN HONG
分类号 H01L21/68 主分类号 H01L21/68
代理机构 代理人
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