| 摘要 |
Adapter device, particularly for machines for the analysis and testing of printed circuits, which is formed by a universal grid and a grid for supporting one or more printed circuits. The supporting grid is spaced apart from the universal grid and has a plurality of collimation holes between test points present on the printed circuit or on each printed circuit, and measurement points on the universal grid. These holes extend partly in the perpendicular direction and partly in an inclined direction with respect to the universal grid. A contact pin is provided between each test point and a corresponding measurement point. <IMAGE> |
