| 摘要 |
The stack reflectance is predicted from an on-line, wavelength dependent measurement of the sheet reflectance and the on-line measurement of the sheet opacity at a wavelength interval. The stack reflectance Rst is then used to predict and/or control stack color, preferably by using the parameter K/S=(1-Rst2)/2 Rst where K is the dye absorption coefficient and S is the dye scattering coefficient.
|
