发明名称 |
FLATNING METHOD OF SEMICONDUCTOR |
摘要 |
The planarising method comprises the steps of forming a first oxide film (1) onto a substrate (1); coating a polycrystal silicon layer (3) on the first oxide film (2); forming patterns on the poly-Si layer (3) by using a photo-masking process; applying an antioxidation insulating film (7) thereon; coating an oxide film (4) onto the insulating film (7), the oxide film being doped by impurities; heat-treating the oxide film at high temp. to planarise it. The insulating film prevents the Si substrate and poly-Si layer from oxidising to protect them when planarising of the oxide film with impurities.
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申请公布号 |
KR920000705(B1) |
申请公布日期 |
1992.01.20 |
申请号 |
KR19880008697 |
申请日期 |
1988.07.13 |
申请人 |
SAM SUNG ELECTRONICS CO., LTD. |
发明人 |
AN, YONG - CHUL;LEE, SU - CHUN |
分类号 |
H01L21/302;(IPC1-7):H01L21/302 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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