发明名称 FLATNING METHOD OF SEMICONDUCTOR
摘要 The planarising method comprises the steps of forming a first oxide film (1) onto a substrate (1); coating a polycrystal silicon layer (3) on the first oxide film (2); forming patterns on the poly-Si layer (3) by using a photo-masking process; applying an antioxidation insulating film (7) thereon; coating an oxide film (4) onto the insulating film (7), the oxide film being doped by impurities; heat-treating the oxide film at high temp. to planarise it. The insulating film prevents the Si substrate and poly-Si layer from oxidising to protect them when planarising of the oxide film with impurities.
申请公布号 KR920000705(B1) 申请公布日期 1992.01.20
申请号 KR19880008697 申请日期 1988.07.13
申请人 SAM SUNG ELECTRONICS CO., LTD. 发明人 AN, YONG - CHUL;LEE, SU - CHUN
分类号 H01L21/302;(IPC1-7):H01L21/302 主分类号 H01L21/302
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