| 摘要 |
PURPOSE:To enable cost to be reduced by eliminating a common part from a device interface testing machine by forming a structure with three different hierarchies of a device interface testing machine, a common testing machine, and an I/O device. CONSTITUTION:This testing machine consists of a personal computer 11 of I/O device, a common testing machine 13, and an interface testing machine 15 (15-1 - 15-N). First, designation numbers and test items within the testing machine 15 are designed from the computer 11 and product devices 17 (17-1 - 17-N) to be connected are tested by the designated testing machine 15 through the testing machine 13. The result is indicated by the computer 11 through the testing machine 13. At this time, each testing machine 15 does not have any common part, becomes compact, and each cost at a part corresponding to the products can be reduced. Also, a plurality of testing machines 15 can be connected to the testing machine 13 and the part of the testing machine 13 can be reduced when testing a number of the same or different types of devices 17 simultaneously. |
