发明名称 MANUFACTURE OF ELEMENT HAVING PATTERN STRUCTURE
摘要 PURPOSE:To form a fine circuit pattern without generating failures in pattern resolution by dividing a continuous opening pattern to constitute a partial pattern having openings respectively separated by light shields and by periodically giving phase difference to rays of illuminating light penetrating through openings. CONSTITUTION:A partial pattern 9 is constituted by splitting a continuous opening pattern so that openings may be isolated by light shields 7. This partial pattern 9 is phase shift layers 5 alternately at adjacent openings on a photomask. Rays of illuminating light penetrating through the opening pattern on the photomask become those which show 0 deg. phases in opening pattern regions 86 and 180 deg. phases in phase shift layer regions 5. Changing the opening into the partial pattern prepared by isolation prevents the phase of the ray of illuminating light from rapidly changing 0 deg. 180 deg. and generating such a boundary that causes failures in pattern resolution. When the pattern is transferred onto a substrate wafer using this phase shift reticle, grating part pattern c and hole part pattern d are resolved.
申请公布号 JPH0410407(A) 申请公布日期 1992.01.14
申请号 JP19900109997 申请日期 1990.04.27
申请人 HITACHI LTD 发明人 IMURA AKIRA;HOSHINA YOSHINORI;ASAI KENGO;HIKITA MITSUTAKA;ISOBE ATSUSHI;SUZUKI MAKOTO;ODA KOJI;SAKIYAMA KAZUYUKI
分类号 G03F1/00;G03F1/30;G03F1/68;G03F7/20;H01L21/027;H01L21/30;H03H3/08 主分类号 G03F1/00
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