发明名称 CHARGED PARTICLE DETECTION DEVICES
摘要 A charged particle detector consists of a plurality independent light guide modules assembled together to form a segmented in-lens on-axis annular detector, with a center hole for allowing the primary charged particle beam to pass through. One side of the assembly facing the specimen is coated with or bonded to scintillator material as the charged particle detection surface. Each light guide module is coupled to a photomultiplier tube to allow light signals transmitted through each light guide module to be amplified and processed separately. A charged particle detector is made from a single block of light guide material processed to have a cone shaped circular cutout from one face, terminating on the opposite face to an opening to allow the primary charged particle beam to pass through. The opposite face is coated with or bonded to scintillator material as the charged particle detection surface. The outer region of the light guide block is shaped into four separate light guide output channels and each light guide output channel is coupled to a photomultiplier tube to allow light signal output from each channel to be amplified and processed separately.
申请公布号 US2008315094(A1) 申请公布日期 2008.12.25
申请号 US20080204282 申请日期 2008.09.04
申请人 WANG JOE;ZHANG XU;CHEN ZHONG-WEI 发明人 WANG JOE;ZHANG XU;CHEN ZHONG-WEI
分类号 G01N23/00 主分类号 G01N23/00
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