| 摘要 |
PURPOSE:To match the phase of a scan driving signal at every driving circuit by loading a multiplexer on a DUT socket, sampling the center of rise and fall at a sample-and-hold circuit by selecting the scan driving signal, and adjusting a variable delay element so as to minimize fluctuation. CONSTITUTION:The multiplexer 500 is loaded on the DUT socket 302, and the scan driving signal DS supplied to the DUT socket 302 is fetched selectively sequentially by the multiplexer 500, and a fetched scan driving signal DS is supplied to the sample-and-hold circuit 305, and the timing of rise and fall of the scan driving signal are captured at the sample-and-hold circuit 305. The delay time difference of the scan driving signal DS is measured from the timing of the rise and fall of the scan driving signal by a delay time measuring means 124, and the delay time of the variable delay element 114 is adjusted so as to set the delay time of a driving circuit 301 at zero. Thereby, it is possible to match the phase of the scan driving signal DS supplied to an image sensor to be tested. |
